The design process of RF components and systems utilizes a collection of measurement techniques during the development process [see picture]. This results in a lack of a coherent and unifying link between the development stages. It is difficult to create a direct link between the fundamental circuit theory required for power amplifiers and existing test solutions. These challenges have been prevalent in nonlinear simulation modeling efforts. The resulting lack of coherent integration across CAD, measurements and application can result in sub-optimal design and potential reliability issues in manufacturing.
The Mesuro solution overcomes the fragmented approach by basing its principal on the measurement and engineering of the device terminal current and voltage waveforms. Measurement results which are obtained from early stages in the design process allow for reliable prediction of system level performance. Measurements from later stages allow the identification of causes at the transistor level or even link it directly to fundamental circuit theory. The ability to mix-and-match simulations/ models when appropriate and import measurements into CAD results in additional accuracy and faster time-to-market
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