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Services

Gain the benefit of our years of understanding and knowledge to better understand your device capabilities and operating conditions.
Experience the power of Mesuro’s Active Harmonic source/load pull technology with Waveform Engineering, through the use of our in-house measurement and characterization facilities.
We are able to offer the following characterization of on-wafer, mounted chip or packaged devices:

  1. DCIV;
  2. S-Parameter and Large Signal S Parameters; and
  3. Basic Load Pull characterization of on-wafer, mounted chip or packaged devices.

These basic tests can then be enhanced through combinations of active load pull test parameters to provide further diagnostic and design information.

Let Mesuro characterize your device for you, we can offer services utilizing all of our product variants and implement test.

Contact us directly to discuss your measurement requirements.

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